RELIABILITY, PACKAGING, TESTING, AND CHARACTERIZATION OF MEMS/MOEMS AND NANODEVICES XI

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044506

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Title: Reliability, Packaging, Testing, and Characterization of MEMS/MOEMS and Nanodevices XI
Subtitle: At SPIE MOEMS-MEMS
Date/Location: Held 23-24 January 2012, San Francisco, California, USA.
Series: Proceedings of SPIE Volume 8250
Editor: Garcia-Blanco, Sonia M.
ISBN: 9780819488930
Pages: 174 (1 Vol) (approx)
Format: Softcover
Publisher: SPIE - International Society for Optics and Photonics
POD Publisher: Curran Associates, Inc. ( Mar 2012 )

Title: Reliability, Packaging, Testing, and Characterization of MEMS/MOEMS and Nanodevices XI
Subtitle: At SPIE MOEMS-MEMS
Date/Location: Held 23-24 January 2012, San Francisco, California, USA.
Series: Proceedings of SPIE Volume 8250
Editor: Garcia-Blanco, Sonia M.
ISBN: 9780819488930
Pages: 174 (1 Vol) (approx)
Format: Softcover
Publisher: SPIE - International Society for Optics and Photonics
POD Publisher: Curran Associates, Inc. ( Mar 2012 )