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2011 INTERNATIONAL CONFERENCE ON OPTICAL INSTRUMENTS AND TECHNOLOGY: OPTOELECTRONIC MEASUREMENT TECHNOLOGY AND SYSTEMS
- Item #:
- 044457
- UPC:
Details
-
Title:
2011 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems
-
Date/Location:
Held 6-9 November 2011, Beijing, Beijing, China.
-
Series:
Proceedings of SPIE Volume 8201
-
Editor:
Dong, Xinyong
-
ISBN:
9780819488428
-
Pages:
660 (1 Vol) (approx)
-
Format:
Softcover
-
Publisher:
SPIE - International Society for Optics and Photonics
-
POD Publisher:
Curran Associates, Inc. ( Dec 2011 )
-
Title:
2011 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems
-
Date/Location:
Held 6-9 November 2011, Beijing, Beijing, China.
-
Series:
Proceedings of SPIE Volume 8201
-
Editor:
Dong, Xinyong
-
ISBN:
9780819488428
-
Pages:
660 (1 Vol) (approx)
-
Format:
Softcover
-
Publisher:
SPIE - International Society for Optics and Photonics
-
POD Publisher:
Curran Associates, Inc. ( Dec 2011 )