TIME AND FREQUENCY METROLOGY III

TIME AND FREQUENCY METROLOGY III

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044388
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Details

  • Title: Time and Frequency Metrology III
  • Subtitle: At SPIE Optical Engineering + Applications
  • Date/Location: Held 24-25 August 2011, San Diego, California, USA.
  • Series: Proceedings of SPIE Volume 8132
  • Editor: Ido, Tetsuya
  • ISBN: 9780819487421
  • Pages: 90 (1 Vol) (approx)
  • Format: Softcover
  • Publisher: SPIE - International Society for Optics and Photonics
  • POD Publisher: Curran Associates, Inc. ( Sep 2011 )

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  • Title: Time and Frequency Metrology III
  • Subtitle: At SPIE Optical Engineering + Applications
  • Date/Location: Held 24-25 August 2011, San Diego, California, USA.
  • Series: Proceedings of SPIE Volume 8132
  • Editor: Ido, Tetsuya
  • ISBN: 9780819487421
  • Pages: 90 (1 Vol) (approx)
  • Format: Softcover
  • Publisher: SPIE - International Society for Optics and Photonics
  • POD Publisher: Curran Associates, Inc. ( Sep 2011 )