DAMAGE TO VUV, EUV, AND X-RAY OPTICS III

DAMAGE TO VUV, EUV, AND X-RAY OPTICS III

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044333
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Details

  • Title: Damage to VUV, EUV, and X-ray Optics III
  • Subtitle: At SPIE Optics + Optoelectronics
  • Date/Location: Held 18-19 April 2011, Prague, Czech Republic.
  • Series: Proceedings of SPIE Volume 8077
  • Editor: Juha, Libor
  • ISBN: 9780819486677
  • Pages: 290 (1 Vol) (approx)
  • Format: Softcover
  • Publisher: SPIE - International Society for Optics and Photonics
  • POD Publisher: Curran Associates, Inc. ( May 2011 )

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Tab 4

 
  • Title: Damage to VUV, EUV, and X-ray Optics III
  • Subtitle: At SPIE Optics + Optoelectronics
  • Date/Location: Held 18-19 April 2011, Prague, Czech Republic.
  • Series: Proceedings of SPIE Volume 8077
  • Editor: Juha, Libor
  • ISBN: 9780819486677
  • Pages: 290 (1 Vol) (approx)
  • Format: Softcover
  • Publisher: SPIE - International Society for Optics and Photonics
  • POD Publisher: Curran Associates, Inc. ( May 2011 )