SCANNING MICROSCOPIES 2011: ADVANCED MICROSCOPY TECHNOLOGIES FOR DEFENSE, HOMELAND SECURITY, FORENSIC, LIFE, ENVIRONMENTAL, AND INDUSTRIAL SCIENCES

SCANNING MICROSCOPIES 2011: ADVANCED MICROSCOPY TECHNOLOGIES FOR DEFENSE, HOMELAND SECURITY, FORENSIC, LIFE, ENVIRONMENTAL, AND INDUSTRIAL SCIENCES

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  • Title: Scanning Microscopies 2011: Advanced Microscopy Technologies for Defense, Homeland Security, Forensic, Life, Environmental, and Industrial Sciences
  • Subtitle: At SPIE Defense, Security, and Sensing
  • Date/Location: Held 26-28 April 2011, Orlando, Florida, USA.
  • Series: Proceedings of SPIE Volume 8036
  • Editor: Postek, Michael T.
  • ISBN: 9780819486103
  • Pages: 254 (1 Vol) (approx)
  • Format: Softcover
  • Publisher: SPIE - International Society for Optics and Photonics
  • POD Publisher: Curran Associates, Inc. ( Jun 2011 )

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  • Title: Scanning Microscopies 2011: Advanced Microscopy Technologies for Defense, Homeland Security, Forensic, Life, Environmental, and Industrial Sciences
  • Subtitle: At SPIE Defense, Security, and Sensing
  • Date/Location: Held 26-28 April 2011, Orlando, Florida, USA.
  • Series: Proceedings of SPIE Volume 8036
  • Editor: Postek, Michael T.
  • ISBN: 9780819486103
  • Pages: 254 (1 Vol) (approx)
  • Format: Softcover
  • Publisher: SPIE - International Society for Optics and Photonics
  • POD Publisher: Curran Associates, Inc. ( Jun 2011 )