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OPTICAL METROLOGY AND INSPECTION FOR INDUSTRIAL APPLICATIONS
- Item #:
- 044111
- UPC:
Details
-
Title:
Optical Metrology and Inspection for Industrial Applications
-
Subtitle:
At Photonics Asia 2010
-
Date/Location:
Held 18-20 October 2010, Beijing, China.
-
Series:
Proceedings of SPIE Volume 7855
-
Editor:
Harding, Kevin G.
-
ISBN:
9780819483850
-
Pages:
532 (1 Vol) (approx)
-
Format:
Softcover
-
Publisher:
SPIE - International Society for Optics and Photonics
-
POD Publisher:
Curran Associates, Inc. ( Nov 2010 )
-
Title:
Optical Metrology and Inspection for Industrial Applications
-
Subtitle:
At Photonics Asia 2010
-
Date/Location:
Held 18-20 October 2010, Beijing, China.
-
Series:
Proceedings of SPIE Volume 7855
-
Editor:
Harding, Kevin G.
-
ISBN:
9780819483850
-
Pages:
532 (1 Vol) (approx)
-
Format:
Softcover
-
Publisher:
SPIE - International Society for Optics and Photonics
-
POD Publisher:
Curran Associates, Inc. ( Nov 2010 )