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EXTREME ULTRAVIOLET (EUV) LITHOGRAPHY
- Item #:
- 043892
- UPC:
Details
-
Title:
Extreme Ultraviolet (EUV) Lithography
-
Subtitle:
At SPIE Advanced Lithography
-
Date/Location:
Held 22-25 February 2010, San Jose, California, USA.
-
Series:
Proceedings of SPIE Volume 7636
-
Editor:
La Fontaine, Bruno
-
ISBN:
9780819480507
-
Pages:
1,064 (2 Vols) (approx)
-
Format:
Softcover
-
Publisher:
SPIE - International Society for Optics and Photonics
-
POD Publisher:
Curran Associates, Inc. ( Mar 2010 )
-
Title:
Extreme Ultraviolet (EUV) Lithography
-
Subtitle:
At SPIE Advanced Lithography
-
Date/Location:
Held 22-25 February 2010, San Jose, California, USA.
-
Series:
Proceedings of SPIE Volume 7636
-
Editor:
La Fontaine, Bruno
-
ISBN:
9780819480507
-
Pages:
1,064 (2 Vols) (approx)
-
Format:
Softcover
-
Publisher:
SPIE - International Society for Optics and Photonics
-
POD Publisher:
Curran Associates, Inc. ( Mar 2010 )