2009 INTERNATIONAL CONFERENCE ON OPTICAL INSTRUMENTS AND TECHNOLOGY: OPTOELECTRONIC MEASUREMENT TECHNOLOGY AND SYSTEMS

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043767

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Title: 2009 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems
Subtitle: At International Conference on Optical Instrumentation and Technology
Date/Location: Held 19-22 October 2009, Shanghai, China.
Series: Proceedings of SPIE Volume 7511
Editor: Ye, Shenghua
ISBN: 9780819478979
Pages: 646 (1 Vol) (approx)
Format: Softcover
Publisher: SPIE - International Society for Optics and Photonics
POD Publisher: Curran Associates, Inc. ( Nov 2009 )

Title: 2009 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems
Subtitle: At International Conference on Optical Instrumentation and Technology
Date/Location: Held 19-22 October 2009, Shanghai, China.
Series: Proceedings of SPIE Volume 7511
Editor: Ye, Shenghua
ISBN: 9780819478979
Pages: 646 (1 Vol) (approx)
Format: Softcover
Publisher: SPIE - International Society for Optics and Photonics
POD Publisher: Curran Associates, Inc. ( Nov 2009 )