OPTICAL INSPECTION AND METROLOGY FOR NON-OPTICS INDUSTRIES

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043688
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Details

  • Title: Optical Inspection and Metrology for Non-Optics Industries
  • Subtitle: At SPIE Optical Engineering + Applications
  • Date/Location: Held 3-4 August 2009, San Diego, California, USA.
  • Series: Proceedings of SPIE Volume 7432
  • Editor: Huang, Peisen S.
  • ISBN: 9780819477224
  • Pages: 378 (1 Vol) (approx)
  • Format: Softcover
  • Publisher: SPIE - International Society for Optics and Photonics
  • POD Publisher: Curran Associates, Inc. ( Sep 2009 )

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  • Title: Optical Inspection and Metrology for Non-Optics Industries
  • Subtitle: At SPIE Optical Engineering + Applications
  • Date/Location: Held 3-4 August 2009, San Diego, California, USA.
  • Series: Proceedings of SPIE Volume 7432
  • Editor: Huang, Peisen S.
  • ISBN: 9780819477224
  • Pages: 378 (1 Vol) (approx)
  • Format: Softcover
  • Publisher: SPIE - International Society for Optics and Photonics
  • POD Publisher: Curran Associates, Inc. ( Sep 2009 )