TIME AND FREQUENCY METROLOGY II

TIME AND FREQUENCY METROLOGY II

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043687
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  • Title: Time and Frequency Metrology II
  • Subtitle: At SPIE Optical Engineering + Applications
  • Date/Location: Held 5 August 2009, San Diego, California, USA.
  • Series: Proceedings of SPIE Volume 7431
  • Editor: Ido, Tetsuya
  • ISBN: 9780819477217
  • Pages: 108 (1 Vol) (approx)
  • Format: Softcover
  • Publisher: SPIE - International Society for Optics and Photonics
  • POD Publisher: Curran Associates, Inc. ( Aug 2009 )

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  • Title: Time and Frequency Metrology II
  • Subtitle: At SPIE Optical Engineering + Applications
  • Date/Location: Held 5 August 2009, San Diego, California, USA.
  • Series: Proceedings of SPIE Volume 7431
  • Editor: Ido, Tetsuya
  • ISBN: 9780819477217
  • Pages: 108 (1 Vol) (approx)
  • Format: Softcover
  • Publisher: SPIE - International Society for Optics and Photonics
  • POD Publisher: Curran Associates, Inc. ( Aug 2009 )