INSTRUMENTATION, METROLOGY, AND STANDARDS FOR NANOMANUFACTURING III

INSTRUMENTATION, METROLOGY, AND STANDARDS FOR NANOMANUFACTURING III

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  • Title: Instrumentation, Metrology, and Standards for Nanomanufacturing III
  • Subtitle: At SPIE NanoScience + Engineering
  • Date/Location: Held 4-5 August 2009, San Diego, California, USA.
  • Series: Proceedings of SPIE Volume 7405
  • Editor: Postek, Michael T.
  • ISBN: 9780819476951
  • Pages: 276 (1 Vol) (approx)
  • Format: Softcover
  • Publisher: SPIE - International Society for Optics and Photonics
  • POD Publisher: Curran Associates, Inc. ( Aug 2009 )

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  • Title: Instrumentation, Metrology, and Standards for Nanomanufacturing III
  • Subtitle: At SPIE NanoScience + Engineering
  • Date/Location: Held 4-5 August 2009, San Diego, California, USA.
  • Series: Proceedings of SPIE Volume 7405
  • Editor: Postek, Michael T.
  • ISBN: 9780819476951
  • Pages: 276 (1 Vol) (approx)
  • Format: Softcover
  • Publisher: SPIE - International Society for Optics and Photonics
  • POD Publisher: Curran Associates, Inc. ( Aug 2009 )