INTERNATIONAL SYMPOSIUM ON PHOTOELECTRONIC DETECTION AND IMAGING 2009: MATERIAL AND DEVICE TECHNOLOGY FOR SENSORS

Item #:

043637

Our Price: $140.00

Details

Title: International Symposium on Photoelectronic Detection and Imaging 2009: Material and Device Technology for Sensors
Subtitle: At International Symposium on Photoelectronic Detection and Imaging 2009
Date/Location: Held 17-19 June 2009, Beijing, China.
Series: Proceedings of SPIE Volume 7381
Editor: Chen, Xuyuan
ISBN: 9780819476623
Pages: 796 (1 Vol) (approx)
Format: Softcover
Publisher: SPIE - International Society for Optics and Photonics
POD Publisher: Curran Associates, Inc. ( Aug 2009 )

Title: International Symposium on Photoelectronic Detection and Imaging 2009: Material and Device Technology for Sensors
Subtitle: At International Symposium on Photoelectronic Detection and Imaging 2009
Date/Location: Held 17-19 June 2009, Beijing, China.
Series: Proceedings of SPIE Volume 7381
Editor: Chen, Xuyuan
ISBN: 9780819476623
Pages: 796 (1 Vol) (approx)
Format: Softcover
Publisher: SPIE - International Society for Optics and Photonics
POD Publisher: Curran Associates, Inc. ( Aug 2009 )