DAMAGE TO VUV, EUV, AND X-RAY OPTICS II

DAMAGE TO VUV, EUV, AND X-RAY OPTICS II

Item #:
043617
Our Price: $80.00
Adding to cart… The item has been added

Details

  • Title: Damage to VUV, EUV, and X-Ray Optics II
  • Subtitle: At SPIE Optics + Optoelectronics
  • Date/Location: Held 22-23 April 2009, Prague, Czech Republic.
  • Series: Proceedings of SPIE Volume 7361
  • Editor: Juha, Libor
  • ISBN: 9780819476357
  • Pages: 308 (1 Vol) (approx)
  • Format: Softcover
  • Publisher: SPIE - International Society for Optics and Photonics
  • POD Publisher: Curran Associates, Inc. ( May 2009 )

Description

 

Members/Attendees

 

Tab 4

 
  • Title: Damage to VUV, EUV, and X-Ray Optics II
  • Subtitle: At SPIE Optics + Optoelectronics
  • Date/Location: Held 22-23 April 2009, Prague, Czech Republic.
  • Series: Proceedings of SPIE Volume 7361
  • Editor: Juha, Libor
  • ISBN: 9780819476357
  • Pages: 308 (1 Vol) (approx)
  • Format: Softcover
  • Publisher: SPIE - International Society for Optics and Photonics
  • POD Publisher: Curran Associates, Inc. ( May 2009 )