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2008 INTERNATIONAL CONFERENCE ON OPTICAL INSTRUMENTS AND TECHNOLOGY: OPTOELECTRONIC MEASUREMENT TECHNOLOGY AND APPLICATIONS
- Item #:
- 043416
- UPC:
Details
-
Title:
2008 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Applications
-
Subtitle:
At International Conference of Optical Instrument and Technology
-
Date/Location:
Held 16-19 November 2008, Beijing, China.
-
Series:
Proceedings of SPIE Volume 7160
-
ISBN:
9780819474049
-
Pages:
880 (1 Vol) (approx)
-
Format:
Softcover
-
Publisher:
SPIE - International Society for Optics and Photonics
-
POD Publisher:
Curran Associates, Inc. ( Jan 2009 )
-
Title:
2008 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Applications
-
Subtitle:
At International Conference of Optical Instrument and Technology
-
Date/Location:
Held 16-19 November 2008, Beijing, China.
-
Series:
Proceedings of SPIE Volume 7160
-
ISBN:
9780819474049
-
Pages:
880 (1 Vol) (approx)
-
Format:
Softcover
-
Publisher:
SPIE - International Society for Optics and Photonics
-
POD Publisher:
Curran Associates, Inc. ( Jan 2009 )