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TWO- AND THREE-DIMENSIONAL METHODS FOR INSPECTION AND METROLOGY VI
- Item #:
- 043322
- UPC:
Details
-
Title:
Two- and Three-Dimensional Methods for Inspection and Metrology VI
-
Subtitle:
At Optical Engineering + Applications
-
Date/Location:
Held 10 August 2008, San Diego, California, USA.
-
Series:
Proceedings of SPIE Volume 7066
-
Editor:
Huang, Peisen S.
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ISBN:
9780819472861
-
Pages:
178 (1 Vol) (approx)
-
Format:
Softcover
-
Publisher:
SPIE - International Society for Optics and Photonics
-
POD Publisher:
Curran Associates, Inc. ( Aug 2008 )
-
Title:
Two- and Three-Dimensional Methods for Inspection and Metrology VI
-
Subtitle:
At Optical Engineering + Applications
-
Date/Location:
Held 10 August 2008, San Diego, California, USA.
-
Series:
Proceedings of SPIE Volume 7066
-
Editor:
Huang, Peisen S.
-
ISBN:
9780819472861
-
Pages:
178 (1 Vol) (approx)
-
Format:
Softcover
-
Publisher:
SPIE - International Society for Optics and Photonics
-
POD Publisher:
Curran Associates, Inc. ( Aug 2008 )