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ADVANCED CHARACTERIZATION TECHNIQUES FOR OPTICS, SEMICONDUCTORS, AND NANOTECHNOLOGIES III
- Item #:
- 042932
- UPC:
Details
-
Title:
Advanced Characterization Techniques for Optics, Semiconductors, and Nanotechnologies III
-
Subtitle:
At Optical Engineering + Applications
-
Date/Location:
Held 28-29 August 2007, San Diego, California, USA.
-
Series:
Proceedings of SPIE Volume 6672
-
Editor:
Duparre, Angela
-
ISBN:
9780819468208
-
Pages:
250 (1 Vol) (approx)
-
Format:
Softcover
-
Publisher:
SPIE - International Society for Optics and Photonics
-
POD Publisher:
Curran Associates, Inc. ( Sep 2007 )
-
Title:
Advanced Characterization Techniques for Optics, Semiconductors, and Nanotechnologies III
-
Subtitle:
At Optical Engineering + Applications
-
Date/Location:
Held 28-29 August 2007, San Diego, California, USA.
-
Series:
Proceedings of SPIE Volume 6672
-
Editor:
Duparre, Angela
-
ISBN:
9780819468208
-
Pages:
250 (1 Vol) (approx)
-
Format:
Softcover
-
Publisher:
SPIE - International Society for Optics and Photonics
-
POD Publisher:
Curran Associates, Inc. ( Sep 2007 )