Details
- Title: 2024 IEEE/ACM International Workshop on Deep Learning for Testing and Testing for Deep Learning (DeepTest 2024)
- Date/Location: Held 20 April 2024, Lisbon, Portugal.
- IEEE #: CFP24T82-POD
- ISBN: 9798350388237
- Pages: 33 (1 Vol)
- Format: Softcover
- TOC Link: View Table of Contents
- Publisher: Institute of Electrical and Electronics Engineers (IEEE)
- POD Publisher: Curran Associates, Inc. ( Dec 2024 )
Description
Members/Attendees
Tab 4
- Title: 2024 IEEE/ACM International Workshop on Deep Learning for Testing and Testing for Deep Learning (DeepTest 2024)
- Date/Location: Held 20 April 2024, Lisbon, Portugal.
- IEEE #: CFP24T82-POD
- ISBN: 9798350388237
- Pages: 33 (1 Vol)
- Format: Softcover
- TOC Link: View Table of Contents
- Publisher: Institute of Electrical and Electronics Engineers (IEEE)
- POD Publisher: Curran Associates, Inc. ( Dec 2024 )