Details
- Title: 2024 IEEE International Conference on Artificial Intelligence Testing (AITest 2024)
- Date/Location: Held 15-18 July 2024, Shanghai, China.
- IEEE #: CFP24S64-POD
- ISBN: 9798350365061
- Pages: 155 (1 Vol)
- Format: Softcover
- TOC Link: View Table of Contents
- Publisher: Institute of Electrical and Electronics Engineers (IEEE)
- POD Publisher: Curran Associates, Inc. ( Dec 2024 )
Description
Members/Attendees
Tab 4
- Title: 2024 IEEE International Conference on Artificial Intelligence Testing (AITest 2024)
- Date/Location: Held 15-18 July 2024, Shanghai, China.
- IEEE #: CFP24S64-POD
- ISBN: 9798350365061
- Pages: 155 (1 Vol)
- Format: Softcover
- TOC Link: View Table of Contents
- Publisher: Institute of Electrical and Electronics Engineers (IEEE)
- POD Publisher: Curran Associates, Inc. ( Dec 2024 )