METROLOGY FOR EXTENDED REALITY, ARTIFICIAL INTELLIGENCE AND NEURAL ENGINEERING. IEEE INTERNATIONAL CONFERENCE. 2023. (MetroXRAINE 2023) (USB)

METROLOGY FOR EXTENDED REALITY, ARTIFICIAL INTELLIGENCE AND NEURAL ENGINEERING. IEEE INTERNATIONAL CONFERENCE. 2023. (MetroXRAINE 2023) (USB)

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072930
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  • Title: 2023 IEEE International Conference on Metrology for eXtended Reality, Artificial Intelligence and Neural Engineering (MetroXRAINE 2023)
  • Date/Location: Held 25-27 October 2023, Milano, Italy.
  • IEEE #: CFP23BQ1-USB
  • ISBN: 9798350300796
  • Format: USB
  • Publisher: Institute of Electrical and Electronics Engineers (IEEE)
  • POD Publisher: Curran Associates, Inc. ( Jul 2024 )

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Tab 4

 
  • Title: 2023 IEEE International Conference on Metrology for eXtended Reality, Artificial Intelligence and Neural Engineering (MetroXRAINE 2023)
  • Date/Location: Held 25-27 October 2023, Milano, Italy.
  • IEEE #: CFP23BQ1-USB
  • ISBN: 9798350300796
  • Format: USB
  • Publisher: Institute of Electrical and Electronics Engineers (IEEE)
  • POD Publisher: Curran Associates, Inc. ( Jul 2024 )