Details
- Title: 2023 IEEE International Conference on Artificial Intelligence Testing (AITest 2023)
- Date/Location: Held 17-20 July 2023, Athens, Greece.
- IEEE #: CFP23S64-POD
- ISBN: 9798350336306
- Pages: 174 (1 Vol)
- Format: Softcover
- TOC Link: View Table of Contents
- Publisher: Institute of Electrical and Electronics Engineers (IEEE)
- POD Publisher: Curran Associates, Inc. ( Nov 2023 )
Description
Members/Attendees
Tab 4
- Title: 2023 IEEE International Conference on Artificial Intelligence Testing (AITest 2023)
- Date/Location: Held 17-20 July 2023, Athens, Greece.
- IEEE #: CFP23S64-POD
- ISBN: 9798350336306
- Pages: 174 (1 Vol)
- Format: Softcover
- TOC Link: View Table of Contents
- Publisher: Institute of Electrical and Electronics Engineers (IEEE)
- POD Publisher: Curran Associates, Inc. ( Nov 2023 )