Details
- Title: 2023 IEEE/ACM International Workshop on Deep Learning for Testing and Testing for Deep Learning (DeepTest 2023)
- Date/Location: Held 15 May 2023, Melbourne, Australia.
- IEEE #: CFP23T82-POD
- ISBN: 9798350338133
- Pages: 33 (1 Vol)
- Format: Softcover
- TOC Link: View Table of Contents
- Publisher: Institute of Electrical and Electronics Engineers (IEEE)
- POD Publisher: Curran Associates, Inc. ( Sep 2023 )
Description
Members/Attendees
Tab 4
- Title: 2023 IEEE/ACM International Workshop on Deep Learning for Testing and Testing for Deep Learning (DeepTest 2023)
- Date/Location: Held 15 May 2023, Melbourne, Australia.
- IEEE #: CFP23T82-POD
- ISBN: 9798350338133
- Pages: 33 (1 Vol)
- Format: Softcover
- TOC Link: View Table of Contents
- Publisher: Institute of Electrical and Electronics Engineers (IEEE)
- POD Publisher: Curran Associates, Inc. ( Sep 2023 )