Details
- Title: 2020 IEEE/ACM 1st International Conference on Automation of Software Test (AST 2020)
- Date/Location: Held 15-16 July 2020, Seoul, South Korea.
- IEEE #: CFP2015D-POD
- ISBN: 9781728198446
- Pages: 111 (1 Vol)
- Format: Softcover
- TOC Link: View Table of Contents
- Publisher: Institute of Electrical and Electronics Engineers (IEEE)
- POD Publisher: Curran Associates, Inc. ( Nov 2023 )
Description
Members/Attendees
Tab 4
- Title: 2020 IEEE/ACM 1st International Conference on Automation of Software Test (AST 2020)
- Date/Location: Held 15-16 July 2020, Seoul, South Korea.
- IEEE #: CFP2015D-POD
- ISBN: 9781728198446
- Pages: 111 (1 Vol)
- Format: Softcover
- TOC Link: View Table of Contents
- Publisher: Institute of Electrical and Electronics Engineers (IEEE)
- POD Publisher: Curran Associates, Inc. ( Nov 2023 )