METROLOGY FOR EXTENDED REALITY, ARTIFICIAL INTELLIGENCE AND NEURAL ENGINEERING. IEEE INTERNATIONAL CONFERENCE. 2022. (MetroXRAINE 2022) (USB)

METROLOGY FOR EXTENDED REALITY, ARTIFICIAL INTELLIGENCE AND NEURAL ENGINEERING. IEEE INTERNATIONAL CONFERENCE. 2022. (MetroXRAINE 2022) (USB)

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066702
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  • Title: 2022 IEEE International Conference on Metrology for Extended Reality, Artificial Intelligence and Neural Engineering (MetroXRAINE 2022)
  • Date/Location: Held 26-28 October 2022, Rome, Italy.
  • IEEE #: CFP22BQ1-USB
  • ISBN: 9781665485739
  • Format: USB
  • Publisher: Institute of Electrical and Electronics Engineers (IEEE)
  • POD Publisher: Curran Associates, Inc. ( Apr 2023 )

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Tab 4

 
  • Title: 2022 IEEE International Conference on Metrology for Extended Reality, Artificial Intelligence and Neural Engineering (MetroXRAINE 2022)
  • Date/Location: Held 26-28 October 2022, Rome, Italy.
  • IEEE #: CFP22BQ1-USB
  • ISBN: 9781665485739
  • Format: USB
  • Publisher: Institute of Electrical and Electronics Engineers (IEEE)
  • POD Publisher: Curran Associates, Inc. ( Apr 2023 )