METROLOGY FOR EXTENDED REALITY, ARTIFICIAL INTELLIGENCE AND NEURAL ENGINEERING. IEEE INTERNATIONAL CONFERENCE. 2022. (MetroXRAINE 2022)

METROLOGY FOR EXTENDED REALITY, ARTIFICIAL INTELLIGENCE AND NEURAL ENGINEERING. IEEE INTERNATIONAL CONFERENCE. 2022. (MetroXRAINE 2022)

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  • Title: 2022 IEEE International Conference on Metrology for Extended Reality, Artificial Intelligence and Neural Engineering (MetroXRAINE 2022)
  • Date/Location: Held 26-28 October 2022, Rome, Italy.
  • IEEE #: CFP22BQ1-POD
  • ISBN: 9781665485753
  • Pages: 741 (1 Vol)
  • Format: Softcover
  • TOC Link: View Table of Contents
  • Publisher: Institute of Electrical and Electronics Engineers (IEEE)
  • POD Publisher: Curran Associates, Inc. ( Apr 2023 )

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  • Title: 2022 IEEE International Conference on Metrology for Extended Reality, Artificial Intelligence and Neural Engineering (MetroXRAINE 2022)
  • Date/Location: Held 26-28 October 2022, Rome, Italy.
  • IEEE #: CFP22BQ1-POD
  • ISBN: 9781665485753
  • Pages: 741 (1 Vol)
  • Format: Softcover
  • TOC Link: View Table of Contents
  • Publisher: Institute of Electrical and Electronics Engineers (IEEE)
  • POD Publisher: Curran Associates, Inc. ( Apr 2023 )