Details
- Title: 2022 IEEE/ACM 7th International Workshop on Metamorphic Testing (MET 2022)
- Date/Location: Held 9 May 2022, Virtual Workshop.
- IEEE #: CFP22G11-POD
- ISBN: 9781665462303
- Pages: 57 (1 Vol)
- Format: Softcover
- TOC Link: View Table of Contents
- Publisher: Institute of Electrical and Electronics Engineers (IEEE)
- POD Publisher: Curran Associates, Inc. ( Aug 2022 )
Description
Members/Attendees
Tab 4
- Title: 2022 IEEE/ACM 7th International Workshop on Metamorphic Testing (MET 2022)
- Date/Location: Held 9 May 2022, Virtual Workshop.
- IEEE #: CFP22G11-POD
- ISBN: 9781665462303
- Pages: 57 (1 Vol)
- Format: Softcover
- TOC Link: View Table of Contents
- Publisher: Institute of Electrical and Electronics Engineers (IEEE)
- POD Publisher: Curran Associates, Inc. ( Aug 2022 )