DESIGN AND TEST OF INTEGRATED MICRO AND NANO-SYSTEMS. IEEE INTERNATIONAL CONFERENCE. 2022. (DTS 2022) (USB)

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064681
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Details

  • Title: 2022 IEEE International Conference on Design & Test of Integrated Micro & Nano-Systems (DTS 2022)
  • Date/Location: Held 6-9 June 2022, Cairo, Egypt.
  • IEEE #: CFP22R38-USB
  • ISBN: 9781665497831
  • Format: USB
  • Publisher: Institute of Electrical and Electronics Engineers (IEEE)
  • POD Publisher: Curran Associates, Inc. ( Aug 2022 )

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Tab 4

 
  • Title: 2022 IEEE International Conference on Design & Test of Integrated Micro & Nano-Systems (DTS 2022)
  • Date/Location: Held 6-9 June 2022, Cairo, Egypt.
  • IEEE #: CFP22R38-USB
  • ISBN: 9781665497831
  • Format: USB
  • Publisher: Institute of Electrical and Electronics Engineers (IEEE)
  • POD Publisher: Curran Associates, Inc. ( Aug 2022 )