PHYSICAL AND FAILURE ANALYSIS OF INTEGRATED CIRCUITS. IEEE INTERNATIONAL SYMPOSIUM. 2021. (IPFA 2021)

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061401
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  • Title: 2021 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA 2021)
  • Date/Location: Held 15 September - 15 October 2021, Singapore.
  • IEEE #: CFP21777-POD
  • ISBN: 9781665439893
  • Pages: 474 (1 Vol)
  • Format: Softcover
  • TOC Link: View Table of Contents
  • Publisher: Institute of Electrical and Electronics Engineers (IEEE)
  • POD Publisher: Curran Associates, Inc. ( Jan 2022 )

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  • Title: 2021 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA 2021)
  • Date/Location: Held 15 September - 15 October 2021, Singapore.
  • IEEE #: CFP21777-POD
  • ISBN: 9781665439893
  • Pages: 474 (1 Vol)
  • Format: Softcover
  • TOC Link: View Table of Contents
  • Publisher: Institute of Electrical and Electronics Engineers (IEEE)
  • POD Publisher: Curran Associates, Inc. ( Jan 2022 )