Details
- Title: 2021 IEEE International Conference on Artificial Intelligence Testing (AITest 2021)
- Date/Location: Held 23-26 August 2021, Virtual Conference.
- IEEE #: CFP21S64-POD
- ISBN: 9781665434829
- Pages: 152 (1 Vol)
- Format: Softcover
- TOC Link: View Table of Contents
- Publisher: Institute of Electrical and Electronics Engineers (IEEE)
- POD Publisher: Curran Associates, Inc. ( Dec 2021 )
Description
Members/Attendees
Tab 4
- Title: 2021 IEEE International Conference on Artificial Intelligence Testing (AITest 2021)
- Date/Location: Held 23-26 August 2021, Virtual Conference.
- IEEE #: CFP21S64-POD
- ISBN: 9781665434829
- Pages: 152 (1 Vol)
- Format: Softcover
- TOC Link: View Table of Contents
- Publisher: Institute of Electrical and Electronics Engineers (IEEE)
- POD Publisher: Curran Associates, Inc. ( Dec 2021 )