Details
- Title: 2021 IEEE/ACM Third International Workshop on Deep Learning for Testing and Testing for Deep Learning (DeepTest 2021)
- Date/Location: Held 1 June 2021, Virtual Conference.
- IEEE #: CFP21T82-POD
- ISBN: 9781665445665
- Pages: 29 (1 Vol)
- Format: Softcover
- TOC Link: View Table of Contents
- Publisher: Institute of Electrical and Electronics Engineers (IEEE)
- POD Publisher: Curran Associates, Inc. ( Sep 2021 )
Description
Members/Attendees
Tab 4
- Title: 2021 IEEE/ACM Third International Workshop on Deep Learning for Testing and Testing for Deep Learning (DeepTest 2021)
- Date/Location: Held 1 June 2021, Virtual Conference.
- IEEE #: CFP21T82-POD
- ISBN: 9781665445665
- Pages: 29 (1 Vol)
- Format: Softcover
- TOC Link: View Table of Contents
- Publisher: Institute of Electrical and Electronics Engineers (IEEE)
- POD Publisher: Curran Associates, Inc. ( Sep 2021 )