Details
- Title: 2020 IEEE International Conference on Artificial Intelligence Testing (AITest 2020)
- Date/Location: Held 3-6 August 2020, Oxford, United Kingdom.
- IEEE #: CFP20S64-POD
- ISBN: 9781728169859
- Pages: 142 (1 Vol)
- Format: Softcover
- TOC Link: View Table of Contents
- Publisher: Institute of Electrical and Electronics Engineers (IEEE)
- POD Publisher: Curran Associates, Inc. ( Sep 2020 )
Description
Members/Attendees
Tab 4
- Title: 2020 IEEE International Conference on Artificial Intelligence Testing (AITest 2020)
- Date/Location: Held 3-6 August 2020, Oxford, United Kingdom.
- IEEE #: CFP20S64-POD
- ISBN: 9781728169859
- Pages: 142 (1 Vol)
- Format: Softcover
- TOC Link: View Table of Contents
- Publisher: Institute of Electrical and Electronics Engineers (IEEE)
- POD Publisher: Curran Associates, Inc. ( Sep 2020 )