Details
- Title: 2020 IEEE International Conference on Design & Test of Integrated Micro & Nano-Systems (DTS 2020)
- Date/Location: Held 7-10 June 2020, Hammamet, Tunisia.
- IEEE #: CFP20R38-POD
- ISBN: 9781728154305
- Pages: 169 (1 Vol)
- Format: Softcover
- TOC Link: View Table of Contents
- Publisher: Institute of Electrical and Electronics Engineers (IEEE)
- POD Publisher: Curran Associates, Inc. ( Oct 2020 )
Description
Members/Attendees
Tab 4
- Title: 2020 IEEE International Conference on Design & Test of Integrated Micro & Nano-Systems (DTS 2020)
- Date/Location: Held 7-10 June 2020, Hammamet, Tunisia.
- IEEE #: CFP20R38-POD
- ISBN: 9781728154305
- Pages: 169 (1 Vol)
- Format: Softcover
- TOC Link: View Table of Contents
- Publisher: Institute of Electrical and Electronics Engineers (IEEE)
- POD Publisher: Curran Associates, Inc. ( Oct 2020 )