Details
- Title: 2020 IEEE 38th VLSI Test Symposium (VTS 2020)
- Date/Location: Held 5-8 April 2020, San Diego, California, USA.
- IEEE #: CFP20029-USB
- ISBN: 9781728153582
- Format: USB
- Publisher: Institute of Electrical and Electronics Engineers (IEEE)
- POD Publisher: Curran Associates, Inc. ( Jul 2020 )
Description
Members/Attendees
Tab 4
- Title: 2020 IEEE 38th VLSI Test Symposium (VTS 2020)
- Date/Location: Held 5-8 April 2020, San Diego, California, USA.
- IEEE #: CFP20029-USB
- ISBN: 9781728153582
- Format: USB
- Publisher: Institute of Electrical and Electronics Engineers (IEEE)
- POD Publisher: Curran Associates, Inc. ( Jul 2020 )