CONDITION ASSESSMENT TECHNIQUES IN ELECTRICAL SYSTEMS. IEEE INTERNATIONAL CONFERENCE. 4TH 2019. (CATCON 2019) (USB)

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054177
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Details

  • Title: 2019 IEEE 4th International Conference on Condition Assessment Techniques in Electrical Systems (CATCON 2019)
  • Date/Location: Held 21-23 November 2019, Chennai, India.
  • IEEE #: CFP1920V-USB
  • ISBN: 9781728143309
  • Format: USB
  • Publisher: Institute of Electrical and Electronics Engineers (IEEE)
  • POD Publisher: Curran Associates, Inc. ( Jul 2020 )

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Tab 4

 
  • Title: 2019 IEEE 4th International Conference on Condition Assessment Techniques in Electrical Systems (CATCON 2019)
  • Date/Location: Held 21-23 November 2019, Chennai, India.
  • IEEE #: CFP1920V-USB
  • ISBN: 9781728143309
  • Format: USB
  • Publisher: Institute of Electrical and Electronics Engineers (IEEE)
  • POD Publisher: Curran Associates, Inc. ( Jul 2020 )