DEFECTS AND MATERIALS ISSUES IN SEMICONDUCTORS - RELATIONSHIP TO OPTOELECTRONIC PROPERTIES AND DEVICE RELIABILITY. (SYMPOSIUM CC/FF AT THE 2015 MRS SPRING MEETING AND EXHIBIT)

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054153

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Title: Defects and Materials Issues in Semiconductors - Relationship to Optoelectronic Properties and Device Reliability
Subtitle: Symposium CC/FF at the 2015 MRS Spring Meeting and Exhibit
Date/Location: Held 6-10 April 2015, San Francisco, California, USA.
Series: Materials Research Society Symposium Proceedings Volume 1792
Editor: Herrick, R. et al.
ISBN: 9781713808206
Pages: 136 (1 Vol)
Format: Softcover
TOC Link: View Table of Contents
Publisher: Cambridge University Press (CUP) / Materials Research Society (MRS)
POD Publisher: Curran Associates, Inc. ( May 2020 )

Title: Defects and Materials Issues in Semiconductors - Relationship to Optoelectronic Properties and Device Reliability
Subtitle: Symposium CC/FF at the 2015 MRS Spring Meeting and Exhibit
Date/Location: Held 6-10 April 2015, San Francisco, California, USA.
Series: Materials Research Society Symposium Proceedings Volume 1792
Editor: Herrick, R. et al.
ISBN: 9781713808206
Pages: 136 (1 Vol)
Format: Softcover
TOC Link: View Table of Contents
Publisher: Cambridge University Press (CUP) / Materials Research Society (MRS)
POD Publisher: Curran Associates, Inc. ( May 2020 )