PHYSICAL AND FAILURE ANALYSIS OF INTEGRATED CIRCUITS. IEEE INTERNATIONAL SYMPOSIUM. 26TH 2019. (IPFA 2019)

Item #:
052501
$144.00 - $288.00
Adding to cart… The item has been added

Details

  • Title: 2019 IEEE 26th International Symposium on Physical and Failure Analysis of Integrated Circuits (IPFA 2019)
  • Date/Location: Held 2-5 July 2019, Hangzhou, China.
  • IEEE #: CFP19777-POD
  • ISBN: 9781728135533
  • Pages: 639 (1 Vol)
  • Format: Softcover
  • TOC Link: View Table of Contents
  • Publisher: Institute of Electrical and Electronics Engineers (IEEE)
  • POD Publisher: Curran Associates, Inc. ( Feb 2020 )

Description

 

Members/Attendees

 

Tab 4

 
  • Title: 2019 IEEE 26th International Symposium on Physical and Failure Analysis of Integrated Circuits (IPFA 2019)
  • Date/Location: Held 2-5 July 2019, Hangzhou, China.
  • IEEE #: CFP19777-POD
  • ISBN: 9781728135533
  • Pages: 639 (1 Vol)
  • Format: Softcover
  • TOC Link: View Table of Contents
  • Publisher: Institute of Electrical and Electronics Engineers (IEEE)
  • POD Publisher: Curran Associates, Inc. ( Feb 2020 )