DESIGN AND TEST OF INTEGRATED MICRO AND NANO-SYSTEMS. IEEE INTERNATIONAL CONFERENCE. 2019. (DTS 2019) (USB)

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051298
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  • Title: 2019 IEEE International Conference on Design & Test of Integrated Micro & Nano-Systems (DTS 2019)
  • Date/Location: Held 28 April - 1 May 2019, Gammarth-Tunis, Tunisia.
  • IEEE #: CFP19R38-USB
  • ISBN: 9781728111285
  • Format: USB
  • Publisher: Institute of Electrical and Electronics Engineers (IEEE)
  • POD Publisher: Curran Associates, Inc. ( Jan 2020 )

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Tab 4

 
  • Title: 2019 IEEE International Conference on Design & Test of Integrated Micro & Nano-Systems (DTS 2019)
  • Date/Location: Held 28 April - 1 May 2019, Gammarth-Tunis, Tunisia.
  • IEEE #: CFP19R38-USB
  • ISBN: 9781728111285
  • Format: USB
  • Publisher: Institute of Electrical and Electronics Engineers (IEEE)
  • POD Publisher: Curran Associates, Inc. ( Jan 2020 )