EXTENDED DEFECTS IN SEMICONDUCTORS. INTERNATIONAL CONFERENCE. 19TH 2018. (EDS2018)

EXTENDED DEFECTS IN SEMICONDUCTORS. INTERNATIONAL CONFERENCE. 19TH 2018. (EDS2018)

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049277
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  • Title: 19th International Conference on Extended Defects in Semiconductors (EDS 2018)
  • Date/Location: Held 24-29 June 2018, Thessaloniki, Greece.
  • Series: Journal of Physics: Conference Series Volume 1190
  • Editor: Komninou, P. et al.
  • ISBN: 9781510888197
  • Pages: 126 (1 Vol) (approx)
  • Format: Softcover
  • Publisher: Institute of Physics Publishing (IOP)
  • POD Publisher: Curran Associates, Inc. ( Jul 2019 )

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  • Title: 19th International Conference on Extended Defects in Semiconductors (EDS 2018)
  • Date/Location: Held 24-29 June 2018, Thessaloniki, Greece.
  • Series: Journal of Physics: Conference Series Volume 1190
  • Editor: Komninou, P. et al.
  • ISBN: 9781510888197
  • Pages: 126 (1 Vol) (approx)
  • Format: Softcover
  • Publisher: Institute of Physics Publishing (IOP)
  • POD Publisher: Curran Associates, Inc. ( Jul 2019 )