FRONTIERS OF CHARACTERIZATION AND METROLOGY FOR NANOELECTRONICS. INTERNATIONAL CONFERENCE. 2017.

FRONTIERS OF CHARACTERIZATION AND METROLOGY FOR NANOELECTRONICS. INTERNATIONAL CONFERENCE. 2017.

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  • Title: International Conference on Frontiers of Characterization and Metrology for Nanoelectronics 2017
  • Date/Location: Held 21-23 March 2017, Monterey, California, USA.
  • Editor: Secula, E. M. et al.
  • ISBN: 9781510839113
  • Pages: 305 (1 Vol)
  • Format: Softcover
  • TOC Link: View Table of Contents
  • Publisher: National Institute of Standards and Technology (NIST)
  • POD Publisher: Curran Associates, Inc. ( Jul 2017 )

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  • Title: International Conference on Frontiers of Characterization and Metrology for Nanoelectronics 2017
  • Date/Location: Held 21-23 March 2017, Monterey, California, USA.
  • Editor: Secula, E. M. et al.
  • ISBN: 9781510839113
  • Pages: 305 (1 Vol)
  • Format: Softcover
  • TOC Link: View Table of Contents
  • Publisher: National Institute of Standards and Technology (NIST)
  • POD Publisher: Curran Associates, Inc. ( Jul 2017 )