DEFECTS IN SEMICONDUCTORS. INTERNATIONAL CONFERENCE. 27TH 2013. (ICDS-2013)

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021542

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Title: International Conference on Defects in Semiconductors 2013
Subtitle: Proceedings of the 27th International Conference on Defects in Semiconductors, ICDS-2013
Date/Location: Held 21-26 July 2013, Bologna, Italy.
Series: AIP Conference Proceedings Volume 1583
Editor: Cavallini, A.
ISBN: 9781632660459
Pages: 275 (1 Vol)
Format: Softcover
TOC Link: View Table of Contents
Publisher: American Institute of Physics (AIP)
POD Publisher: Curran Associates, Inc. ( Apr 2014 )

Title: International Conference on Defects in Semiconductors 2013
Subtitle: Proceedings of the 27th International Conference on Defects in Semiconductors, ICDS-2013
Date/Location: Held 21-26 July 2013, Bologna, Italy.
Series: AIP Conference Proceedings Volume 1583
Editor: Cavallini, A.
ISBN: 9781632660459
Pages: 275 (1 Vol)
Format: Softcover
TOC Link: View Table of Contents
Publisher: American Institute of Physics (AIP)
POD Publisher: Curran Associates, Inc. ( Apr 2014 )