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CURRENT AND FUTURE DEFECTIVITY ISSUES FROM COMPONENTS IN THE SEMICONDUCTOR INDUSTRY. 2012.
- Item #:
- 018228
- UPC:
Details
-
Title:
Current and Future Defectivity Issues from Components in the Semiconductor Industry 2012
-
Date/Location:
Held 12 November 2012, Albany, New York, USA.
-
ISBN:
9781627484190
-
Pages:
214 (1 Vol)
-
Format:
Softcover
-
TOC Link:
View Table of Contents
-
Publisher:
Sematech
-
POD Publisher:
Curran Associates, Inc. ( Jul 2013 )
-
Title:
Current and Future Defectivity Issues from Components in the Semiconductor Industry 2012
-
Date/Location:
Held 12 November 2012, Albany, New York, USA.
-
ISBN:
9781627484190
-
Pages:
214 (1 Vol)
-
Format:
Softcover
-
TOC Link:
View Table of Contents
-
Publisher:
Sematech
-
POD Publisher:
Curran Associates, Inc. ( Jul 2013 )