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MICROSCOPY OF SEMICONDUCTING MATERIALS. INTERNATIONAL CONFERENCE. 17TH 2011.
- Item #:
- 013341
- UPC:
Details
-
Title:
17th International Conference on Microscopy of Semiconducting Materials 2011
-
Date/Location:
Held 4-7 April 2011, Cambridge, UK.
-
Series:
Journal of Physics: Conference Series Volume 326
-
ISBN:
9781618392961
-
Pages:
314 (1 Vol)
-
Format:
Softcover
-
TOC Link:
View Table of Contents
-
Publisher:
Institute of Physics Publishing (IOP)
-
POD Publisher:
Curran Associates, Inc. ( May 2013 )
-
Title:
17th International Conference on Microscopy of Semiconducting Materials 2011
-
Date/Location:
Held 4-7 April 2011, Cambridge, UK.
-
Series:
Journal of Physics: Conference Series Volume 326
-
ISBN:
9781618392961
-
Pages:
314 (1 Vol)
-
Format:
Softcover
-
TOC Link:
View Table of Contents
-
Publisher:
Institute of Physics Publishing (IOP)
-
POD Publisher:
Curran Associates, Inc. ( May 2013 )