Details
- Title: 17th World Conference on Non-Destructive Testing 2008 (WCNDT 2008)
- Date/Location: Held 25-28 October 2008, Shanghai, China.
- ISBN: 9781617828867
- Pages: 3,437 (4 Vols)
- Format: Softcover
- TOC Link: View Table of Contents
- Publisher: International Committee for Non-Destructive Testing (ICNDT)
- POD Publisher: Curran Associates, Inc. ( Jun 2011 )
Description
Members/Attendees
Tab 4
- Title: 17th World Conference on Non-Destructive Testing 2008 (WCNDT 2008)
- Date/Location: Held 25-28 October 2008, Shanghai, China.
- ISBN: 9781617828867
- Pages: 3,437 (4 Vols)
- Format: Softcover
- TOC Link: View Table of Contents
- Publisher: International Committee for Non-Destructive Testing (ICNDT)
- POD Publisher: Curran Associates, Inc. ( Jun 2011 )