EXTENDED DEFECTS IN SEMICONDUCTORS. INTERNATIONAL CONFERENCE. 2010. (EDS 2010)

EXTENDED DEFECTS IN SEMICONDUCTORS. INTERNATIONAL CONFERENCE. 2010. (EDS 2010)

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  • Title: International Conference on Extended Defects in Semiconductors 2010 (EDS 2010)
  • Date/Location: Held 19-24 September 2010, Brighton, UK.
  • Series: Journal of Physics: Conference Series Volume 281
  • ISBN: 9781617827655
  • Pages: 234 (1 Vol)
  • Format: Softcover
  • TOC Link: View Table of Contents
  • Publisher: Institute of Physics Publishing (IOP)
  • POD Publisher: Curran Associates, Inc. ( Jul 2011 )

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  • Title: International Conference on Extended Defects in Semiconductors 2010 (EDS 2010)
  • Date/Location: Held 19-24 September 2010, Brighton, UK.
  • Series: Journal of Physics: Conference Series Volume 281
  • ISBN: 9781617827655
  • Pages: 234 (1 Vol)
  • Format: Softcover
  • TOC Link: View Table of Contents
  • Publisher: Institute of Physics Publishing (IOP)
  • POD Publisher: Curran Associates, Inc. ( Jul 2011 )