Details
- Title: 2009 3rd International Symposium on Empirical Software Engineering and Measurement (ESEM 2009)
- Date/Location: Held 15-16 October 2009, Lake Buena Vista, Florida.
- IEEE #: CFP09ENM-POD
- ISBN: 9781424448425
- Pages: 584 (1 Vol)
- Format: Softcover
- TOC Link: View Table of Contents
- Publisher: Institute of Electrical and Electronics Engineers (IEEE)
- POD Publisher: Curran Associates, Inc. ( Jan 2010 )
Description
Members/Attendees
Tab 4
- Title: 2009 3rd International Symposium on Empirical Software Engineering and Measurement (ESEM 2009)
- Date/Location: Held 15-16 October 2009, Lake Buena Vista, Florida.
- IEEE #: CFP09ENM-POD
- ISBN: 9781424448425
- Pages: 584 (1 Vol)
- Format: Softcover
- TOC Link: View Table of Contents
- Publisher: Institute of Electrical and Electronics Engineers (IEEE)
- POD Publisher: Curran Associates, Inc. ( Jan 2010 )