FOCUSED ION BEAMS FOR MATERIALS CHARACTERIZATION AND MICROMACHINING. (SYMPOSIUM Y AT THE 2008 MRS SPRING MEETING)

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004934

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Title: Focused Ion Beams for Materials Characterization and Micromachining
Subtitle: Symposium Y at the 2008 MRS Spring Meeting
Date/Location: Held 24-28 March 2008, San Francisco, California.
Series: Materials Research Society Symposium Proceedings Volume 1089
ISBN: 9781605608761
Pages: 23 (1 Vol)
Format: Softcover
TOC Link: View Table of Contents
Publisher: Cambridge University Press (CUP) / Materials Research Society (MRS)
POD Publisher: Curran Associates, Inc. ( Apr 2009 )

Title: Focused Ion Beams for Materials Characterization and Micromachining
Subtitle: Symposium Y at the 2008 MRS Spring Meeting
Date/Location: Held 24-28 March 2008, San Francisco, California.
Series: Materials Research Society Symposium Proceedings Volume 1089
ISBN: 9781605608761
Pages: 23 (1 Vol)
Format: Softcover
TOC Link: View Table of Contents
Publisher: Cambridge University Press (CUP) / Materials Research Society (MRS)
POD Publisher: Curran Associates, Inc. ( Apr 2009 )