ANALYTICAL TECHNIQUES FOR SEMICONDUCTOR MATERIALS AND PROCESS CHARACTERIZATION. SYMPOSIUM. 5TH 2007. ALTECH 2007

Item #:
002357
$72.00 - $90.00
Adding to cart… The item has been added

Details

  • Title: Analytical Techniques for Semiconductor Materials and Process Characterization 5 (ALTECH 2007)
  • Date/Location: Held 13-14 September 2007, Munich, Germany.
  • Series: ECS Transactions Volume 10 No.01
  • Editor: Kolbesen, B.O.
  • ISBN: 9781604238259
  • Pages: 161 (1 Vol)
  • Format: Softcover
  • TOC Link: View Table of Contents
  • Publisher: Electrochemical Society (ECS)
  • POD Publisher: Curran Associates, Inc. ( Mar 2008 )

Description

 

Members/Attendees

 

Tab 4

 
  • Title: Analytical Techniques for Semiconductor Materials and Process Characterization 5 (ALTECH 2007)
  • Date/Location: Held 13-14 September 2007, Munich, Germany.
  • Series: ECS Transactions Volume 10 No.01
  • Editor: Kolbesen, B.O.
  • ISBN: 9781604238259
  • Pages: 161 (1 Vol)
  • Format: Softcover
  • TOC Link: View Table of Contents
  • Publisher: Electrochemical Society (ECS)
  • POD Publisher: Curran Associates, Inc. ( Mar 2008 )