Details
- Title: 22nd IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (DFT 2007)
- Date/Location: Held 26-28 September 2007, Rome, Italy.
- Editor: Bolchini, C.
- IEEE #: CFP07078-POD
- ISBN: 9780769528854
- Pages: 537 (1 Vol)
- Format: Softcover
- TOC Link: View Table of Contents
- Publisher: Institute of Electrical and Electronics Engineers (IEEE)
- POD Publisher: Curran Associates, Inc. ( Feb 2008 )
Description
Members/Attendees
Tab 4
- Title: 22nd IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (DFT 2007)
- Date/Location: Held 26-28 September 2007, Rome, Italy.
- Editor: Bolchini, C.
- IEEE #: CFP07078-POD
- ISBN: 9780769528854
- Pages: 537 (1 Vol)
- Format: Softcover
- TOC Link: View Table of Contents
- Publisher: Institute of Electrical and Electronics Engineers (IEEE)
- POD Publisher: Curran Associates, Inc. ( Feb 2008 )