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GATE STACK SCALING: MATERIALS, ROLE OF INTERFACES AND RELIABILITY IMPLICATIONS. (SYMPOSIUM E AT THE 2006 MRS SPRING MEETING)
- Item #:
- 000522
- UPC:
Details
-
Title:
Gate Stack Scaling: Materials, Role of Interfaces And Reliability Implications
-
Subtitle:
Symposium E at the 2006 MRS Spring Meeting
-
Date/Location:
Held 17-21 April 2006, San Francisco, California.
-
Series:
Materials Research Society Symposium Proceedings Volume 917
-
ISBN:
9781558998742
-
Pages:
192 (1 Vol)
-
Format:
Softcover
-
TOC Link:
View Table of Contents
-
Publisher:
Cambridge University Press (CUP) / Materials Research Society (MRS)
-
POD Publisher:
Curran Associates, Inc. ( Mar 2007 )
-
Title:
Gate Stack Scaling: Materials, Role of Interfaces And Reliability Implications
-
Subtitle:
Symposium E at the 2006 MRS Spring Meeting
-
Date/Location:
Held 17-21 April 2006, San Francisco, California.
-
Series:
Materials Research Society Symposium Proceedings Volume 917
-
ISBN:
9781558998742
-
Pages:
192 (1 Vol)
-
Format:
Softcover
-
TOC Link:
View Table of Contents
-
Publisher:
Cambridge University Press (CUP) / Materials Research Society (MRS)
-
POD Publisher:
Curran Associates, Inc. ( Mar 2007 )