OPTICAL, OPTO-ATOMIC, AND ENTANGLEMENT-ENHANCED PRECISION METROLOGY II

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053908

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Details

Title: Optical, Opto-Atomic, and Entanglement-Enhanced Precision Metrology II
Subtitle: At SPIE OPTO
Date/Location: Held 1-6 February 2020, San Francisco, California, USA.
Series: Proceedings of SPIE Volume 11296
Editor: Shahriar, Selim M.
ISBN: 9781510633551
Pages: 320 (1 Vol)
Format: Softcover
TOC Link: View Table of Contents
Publisher: SPIE - International Society for Optics and Photonics
POD Publisher: Curran Associates, Inc. ( Jun 2020 )

Title: Optical, Opto-Atomic, and Entanglement-Enhanced Precision Metrology II
Subtitle: At SPIE OPTO
Date/Location: Held 1-6 February 2020, San Francisco, California, USA.
Series: Proceedings of SPIE Volume 11296
Editor: Shahriar, Selim M.
ISBN: 9781510633551
Pages: 320 (1 Vol)
Format: Softcover
TOC Link: View Table of Contents
Publisher: SPIE - International Society for Optics and Photonics
POD Publisher: Curran Associates, Inc. ( Jun 2020 )