SECOND SYMPOSIUM ON NOVEL TECHNOLOGY OF X-RAY IMAGING

SECOND SYMPOSIUM ON NOVEL TECHNOLOGY OF X-RAY IMAGING

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049195
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Details

  • Title: Second Symposium on Novel Technology of X-Ray Imaging
  • Date/Location: Held 26-28 November 2018, Hefei, China.
  • Series: Proceedings of SPIE Volume 11068
  • Editor: Liu, Jennifer
  • ISBN: 9781510628267
  • Pages: 720 (1 Vol)
  • Format: Softcover
  • TOC Link: View Table of Contents
  • Publisher: SPIE - International Society for Optics and Photonics
  • POD Publisher: Curran Associates, Inc. ( Jul 2019 )

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  • Title: Second Symposium on Novel Technology of X-Ray Imaging
  • Date/Location: Held 26-28 November 2018, Hefei, China.
  • Series: Proceedings of SPIE Volume 11068
  • Editor: Liu, Jennifer
  • ISBN: 9781510628267
  • Pages: 720 (1 Vol)
  • Format: Softcover
  • TOC Link: View Table of Contents
  • Publisher: SPIE - International Society for Optics and Photonics
  • POD Publisher: Curran Associates, Inc. ( Jul 2019 )